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±«Óãtv’s shared research facilities provide essential equipment, services, and expertise that drive research excellence across the university. These "core" facilities are central to ±«Óãtv’s mission and depend on sustained, centralized support. In 2020-21, a consultative review led by the Offices of the Vice President of Research and Innovation and Vice President of Finance and Administration identified ways to enhance support for these facilities, leading to the creation of the DalCore program. Funded by Canada’s Research Support Fund, DalCore promotes the development and sustainability of critical research resources by improving accessibility, streamlining administrative processes, and implementing coordinated, data-driven strategic planning.

In the Summer of 2024, CTRI was approved to join this program and established the Materials Characterization Core Facility (MCCF) to support research excellence at ±«Óãtv. MCCF provides ±«Óãtv researchers with access to a range of instruments for diverse analytical applications organized by technique:

MICROSCOPY
Provides spatial information about materials.

ELECTRON

• Hitachi S-4700 FE Scanning Electron Microscope
  Comments:ÌýMagnifications up to approximately 500,000x, secondary and back-scattered electron image formation, X-ray spectra/mapping (EDS, for Z > 5), digital image acquisition, coating units (gold and carbon).
  Contact:ÌýDr. Eric Moreau,ÌýMechanical Engineering

OPTICAL

• Optical Microscope
  Comments:Ìýup to 1000x, bright/dark field, polarized light, interference contrast, Nemarski contrast, oil immersion lenses, Polaroid, 35 mm and digital image acquisition (black and white).
  Contact:ÌýDr. Kevin Plucknett, Mechanical Engineering

• 3D Laser Scanning Microscope – VK-X1000
  Comments:ÌýNon-contact profile, roughness and film thickness measurements, nanometer resolution, material and shape independent—fully automatic measurement and analysis.
  Contact:ÌýDr. Eric Moreau, Mechanical Engineering

OTHER

• Bruker Bioscope Catalyst Atomic Force Microscope with Horiba Raman Spectrometer
  Comments:Ìý100 microns XY scanner; 22 microns Z-range.
  Contact:ÌýDr. Laurent Kreplak, Physics & Atmospheric Science

• Focused ion beam (FIB) microscope
  Comments:
  Contact:

SPECTROSCOPY/SPECTROMETRY (Also see Chemistry Mass Spectrometry Core Facility)
MeasuresÌýthe interaction of energy with matter.

• State-of-the-art 213 nm laser ablation system coupled to a Thermo iCAP Q quadrupole mass spectrometer
  Comments: Microsampling capability using laser spot sizes of 25-150 microns; analytical sensitivity for a wider variety of elements into the ppb range; selection of matrix-matched sulfide and silicate standards, User-friendly data reduction using Iolite software.
  Contact: Laser Ablation ICP‑MS Lab

RAMAN

• Nicolet NXR 9650 FT-Raman spectrometer
  Comment:ÌýNd: YVO_4Ìý1064 nm laser; spectral range: 4000 cm^-1Ìýto 50 cm^-1;Ìývariable temperature cell (-150 to 150 °C);Ìýdepolarization accessory.
  Contact:ÌýMike Johnson

X-RAY

• VG Microtech MultiLab ESCA 2000 X-ray Photoelectron Spectrometer (XPS)
  Contact:ÌýAndrew George, Physics and Atmospheric Science

• VersaProbe III PHI Scanning X-ray Photoelectron Spectrometer
  Comments: Monochromatic, micro-focused, scanning X-ray source with cluster ion gun for depth profiling of soft materials.
  Contact:ÌýAndrew George, Physics and Atmospheric Science

DIFFRACTION/SCATTERING
Uses interference or elastic interaction of energy with matter.

• Siemens D500 Powder X-ray Diffractometer
  Comments:Ìýstructural analysis of powdered samples (4K to room temperature).
  Contact:ÌýAndy George, Physics & Atmospheric Science

THERMAL ANALYSIS
Uses heat energy to examine phase changes or decomposition in a sample.

• TA Instrument Q200ÌýDifferential Scanning Calorimeter
  Comments:ÌýTemperature range of -170ËšC to 500ËšC
  Contact:ÌýMike Johnson

• Netzsch LFA 427 High-Temperature Laser Flash Thermal Diffusivity Apparatus
  Contact:ÌýDr.ÌýStephen Corbin,ÌýMechanical Engineering

• Netzsch 404 F1 Pegasus Differential Scanning Calorimeter
  Comments: Pt furnace (RT to 1500°C), Turbomolecular vacuum pump + high purity inert gasses
  Contact:ÌýDr. Eric Moreau, Mechanical Engineering

• Netzsch STA 449 F1 Simultaneous Thermal Analyser (Differential Scanning Calorimetry + Thermogravimetric Analysis) with GCMS
  Features: SiC furnace RT to 1550 C and Silver furnace -120 to 675 C. In-line Agilent technologies 7820A gas chromatography + 5975 mass spectrometer for evolved gas analysis.
  Contact:ÌýDr. Eric Moreau, Mechanical Engineering